Peter M Walsh

Title: The Innovations of Peter M Walsh

Introduction

Peter M Walsh is an accomplished inventor based in South Windsor, Connecticut. He has made significant contributions to the field of optical inspection systems, particularly in the context of printed circuit board (PCB) defect detection. With a total of three patents to his name, Walsh's work exemplifies innovation and technical expertise.

Latest Patents

Among his latest patents is an automatic optical inspection system that utilizes a weighted transition database. This method and apparatus generate a reference database image of a PCB, incorporating tolerances for each individual feature. The invention is characterized by a tolerance database that includes at least three states, where each color is weighted, and adjacent pixels are grouped into arrays or 'bins'. An error signal is produced when the sum of the pixel weights in a bin surpasses a preselected threshold. This innovative approach enhances the accuracy of defect detection in PCBs.

Career Highlights

Peter M Walsh is currently employed at Gerber Systems Corporation, where he continues to develop cutting-edge technologies in the field of optical inspection. His work has not only advanced the capabilities of PCB defect detection systems but has also contributed to the overall efficiency of manufacturing processes.

Collaborations

Walsh has collaborated with notable colleagues, including Ronald J Straayer and Scott P Snietka. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Peter M Walsh's contributions to the field of optical inspection systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of technology and its applications in manufacturing. Through his work at Gerber Systems Corporation, Walsh continues to push the boundaries of what is possible in PCB defect detection.