Company Filing History:
Years Active: 2000-2002
Title: Peleg Lior: Innovator in Integrated Circuit Testing
Introduction
Peleg Lior is a notable inventor based in Rishon Le-Zion, Israel. He has made significant contributions to the field of integrated circuits, particularly in the area of testability architecture. With a total of 2 patents, Lior's work focuses on improving the efficiency and cost-effectiveness of testing modularized integrated circuits.
Latest Patents
Lior's latest patents include a "Testability architecture for modularized integrated circuits" and a "Testability method for modularized integrated circuits." Both patents describe a testability architecture and method that utilizes standalone module testing for integrated circuit chips. These chips consist of several independent modules, with each module connected to the chip's input/output pins and a configuration module. The innovative approach allows for a consistent testing environment for each module design, regardless of the specific chip it is part of. This method not only enhances test coverage but also minimizes the area required for test circuitry on the chip.
Career Highlights
Peleg Lior is currently employed at National Semiconductor Corporation, where he continues to develop and refine his innovative ideas in integrated circuit technology. His work has been instrumental in advancing the field and providing solutions that address common challenges in circuit testing.
Collaborations
Lior has collaborated with several talented individuals, including Alon Shacham and Rami Saban. These partnerships have contributed to the successful development of his patents and innovations.
Conclusion
Peleg Lior's contributions to the field of integrated circuits through his innovative patents demonstrate his commitment to enhancing testing methodologies. His work continues to influence the industry and pave the way for future advancements in technology.