Company Filing History:
Years Active: 2014
Title: Innovations of Patrick W Lunsford
Introduction
Patrick W Lunsford is an accomplished inventor based in Rio Rancho, NM (US). He has made significant contributions to the field of microwave ranging technology, particularly in the context of RFID systems. With a total of 2 patents, Lunsford's work focuses on enhancing the accuracy and reliability of range measurements in challenging environments.
Latest Patents
Lunsford's latest patents include a system and method for microwave ranging to a target in the presence of clutter and multi-path effects. This innovative system is designed to measure the range to an RFID tag, even in situations characterized by high clutter and multi-path signals. The system comprises an RFID reader, an RFID tag, and a coordinated pulse compression radar system. The RFID reader prompts the tag to respond in two distinct backscatter states at different times. The pulse compression radar system then transmits short pulses that are synchronized with the backscatter state of the RFID tag. This coordination allows for the creation of a differential signal, which captures the differences between radar signals obtained during the two states of the tag. As a result, an uncorrupted measure of the round trip time of flight of the radar pulses between the radar system and the RFID tag is achieved.
Career Highlights
Lunsford is currently employed at Amtech Systems, Incorporated, where he continues to develop innovative solutions in the field of microwave ranging. His expertise in this area has positioned him as a key contributor to advancements in RFID technology.
Collaborations
Throughout his career, Lunsford has collaborated with talented individuals such as Kelly Gravelle and Jeremy Landt. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Patrick W Lunsford's contributions to microwave ranging technology and RFID systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges faced in this field and provide solutions that enhance measurement accuracy.