Patrick T Toohey

Title: Innovations of Patrick T Toohey

Introduction

Patrick T Toohey is an accomplished inventor based in Falls Church, VA (US). He has made significant contributions to the field of optical detection technology. With a total of 2 patents to his name, his work focuses on enhancing surveillance capabilities through innovative methods.

Latest Patents

One of Patrick's latest patents is a method for optical detection of surveillance and sniper personnel. This method involves providing a device that detects a biological signature behind a glass surface using non-visible light. It includes emitting one or more pulses of energy at a specific wavelength over a field of illumination towards a target area. The process filters out one or more returning wavelengths from the target area and determines, based on the filtering, if a combination of a fluorescence wavelength and a source wavelength is present. An associated system is also provided to support this method.

Career Highlights

Throughout his career, Patrick has demonstrated a commitment to advancing technology in the field of surveillance. His innovative approaches have garnered attention and recognition within the industry.

Collaborations

Patrick has worked alongside notable colleagues, including Jeffrey Michael Smith and Gerald E Bender. Their collaborative efforts have contributed to the development of cutting-edge technologies.

Conclusion

Patrick T Toohey's contributions to optical detection technology highlight his innovative spirit and dedication to enhancing surveillance methods. His patents reflect a deep understanding of the complexities involved in this field.