Sceaux, France

Patrick Seugnet


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: The Innovations of Patrick Seugnet

Introduction

Patrick Seugnet is an accomplished inventor based in Sceaux, France. He has made significant contributions to the field of imaging technology, particularly through his innovative patent. His work has implications for various applications in the realm of charge transfer devices.

Latest Patents

Patrick Seugnet holds a patent for a "Method and apparatus for scanning a window in the image zone of a charge." This invention involves a series of prior transfers that allow for the efficient scanning of a relatively small window in the image zone of a charge transfer device. By moving the leading edge of the window adjacent to the output shift register, the method significantly reduces the delay between image acquisition and signal processing. This advancement maintains a fixed frame frequency, such as 50 Hz, while optimizing performance.

Career Highlights

Patrick Seugnet is associated with the company Société de Fabrication d'Instruments de Mesure, where he applies his expertise in imaging technology. His innovative approach has positioned him as a key figure in the development of advanced measurement instruments.

Collaborations

One of his notable collaborators is Jean-Claude Roy. Together, they have worked on various projects that leverage their combined expertise in imaging and measurement technologies.

Conclusion

Patrick Seugnet's contributions to the field of imaging technology through his patent demonstrate his innovative spirit and commitment to advancing measurement instruments. His work continues to influence the industry and inspire future developments.

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