Company Filing History:
Years Active: 1995-1998
Title: The Innovations of Pan S Jung
Introduction
Pan S Jung is a notable inventor based in Gilbert, AZ, who has made significant contributions to the field of microscopy. With a total of three patents to his name, he has focused on advancing the technology used in atomic force microscopes, which are essential tools in various scientific research applications.
Latest Patents
One of his latest patents is an atomic force microscope employing beam-tracking. This innovative scanning probe microscope measures features of a sample surface using a sharp probe over an area of interest. It utilizes a collimated light beam reflected from a responsive reflective surface, which detects the movement of the sharp probe relative to the sample surface through a position-sensitive photodetector. The design includes a scanner with one end fixed and the other end free, attached to the sharp probe for movement. Additionally, a mount for a beam tracking lens is fixed to the free end of the scanner, allowing the focus spot of the light beam to track translational movement of the reflective surface caused by the scanner. This design accommodates a wide range of scanning areas, up to about 100 times 100 square micrometers, and allows for scanner head and mode switching without disturbing the sample. The preferred beam tracking lens is bi-convex, and the source of the collimated light beam is a diode laser.
Career Highlights
Throughout his career, Pan S Jung has worked with several companies, including Molecular Imaging Corporation and Molecular Imaging Systems. His experience in these organizations has contributed to his expertise in the field of microscopy and innovation.
Collaborations
Pan S Jung has collaborated with various professionals in his field, including Daphna R Yaniv, enhancing the scope and impact of his work.
Conclusion
Pan S Jung's contributions to the field of atomic force microscopy demonstrate his commitment to innovation and advancement in scientific research tools. His patents reflect a deep understanding of the technology and its applications, making him a significant figure in the world of microscopy.