Owen Y Sit

Title: Owen Y Sit - Innovator in Color Optical Inspection Systems

Introduction

Owen Y Sit is a notable inventor based in Mission Viejo, CA (US). He has made significant contributions to the field of optical inspection technology, particularly with his innovative patent that enhances the detection of defects in electronic devices.

Latest Patents

Owen Y Sit holds a patent for a color optical inspection system. This system is designed to extract only the necessary luma and chroma spatial features required for detecting defects related to the physical characteristics of devices on a board's surface. During the training phase, the system extracts features from devices on several golden boards and compares them against established criteria. This process allows for the selection of spatial features to be used during the inspection phase. A match region is defined by the selected features, and during inspection, the system determines if the features of each device fall within this region. If any extracted features fall outside the match region, a defect is reported. This innovative approach significantly improves the accuracy of defect detection in electronic manufacturing.

Career Highlights

Owen Y Sit is currently employed at Photon Dynamics, Inc., where he continues to develop and refine technologies that enhance optical inspection processes. His work has been instrumental in advancing the capabilities of inspection systems used in the electronics industry.

Collaborations

Owen collaborates with various professionals in his field, including his coworker William K Pratt, to further innovate and improve optical inspection technologies.

Conclusion

Owen Y Sit's contributions to the field of optical inspection through his patented technology demonstrate his commitment to innovation and excellence in electronic manufacturing. His work continues to impact the industry positively.