Location History:
- Osaka, JP (2010)
- Tukuba, JP (2011)
Company Filing History:
2 out of 3,520 
2 out of 989 
Years Active: 2010-2011
Title: The Innovations of Oscar Custance
Introduction
Oscar Custance is a notable inventor based in Tsukuba, Japan. He has made significant contributions to the field of atomic force microscopy, with a focus on enhancing measurement accuracy and efficiency. His work has led to the development of innovative techniques that improve the capabilities of scanning probe microscopes.
Latest Patents
Custance holds two patents that showcase his expertise. The first patent is for an atomic force microscope and interaction force measurement method using atomic force microscope. This invention allows for a frequency shift obtained by an FM-AFM to be expressed through a simple linear coupling of long-range and short-range interaction forces. By measuring the difference in frequency curves derived from atomic defects and target atoms, the method significantly reduces measurement and computational time, leading to improved accuracy and throughput.
The second patent is a probe position control system and method. This invention addresses the challenges posed by thermal drift and other variances that can affect the accuracy of scanning probe microscopes. By controlling the relative position of the probe and the sample while measuring interactions at the atomic level, Custance's method enhances the precision of observations and manipulations.
Career Highlights
Throughout his career, Custance has worked with esteemed organizations such as Shimadzu Corporation and Osaka University. His experience in these institutions has allowed him to refine his skills and contribute to groundbreaking research in the field of atomic force microscopy.
Collaborations
Custance has collaborated with notable colleagues, including Masayuki Abe and Masahiro Ota. These partnerships have further enriched his work and expanded the impact of his inventions.
Conclusion
Oscar Custance's contributions to atomic force microscopy exemplify the spirit of innovation in scientific research. His patents not only enhance measurement techniques but also pave the way for future advancements in the field.