Company Filing History:
1 out of 1,100 
1 out of 2 Years Active: 1990
Title: Osamu Morioka: Innovator in Low-Temperature Testing of IC Devices
Introduction
Osamu Morioka is a notable inventor based in Kakogawa, Japan. He has made significant contributions to the field of integrated circuit (IC) device testing, particularly at low temperatures. His innovative approach has led to the development of a unique apparatus that enhances the performance testing of IC devices.
Latest Patents
Morioka holds a patent for an "Apparatus for testing IC devices at low temperature and cooling bag." This invention includes a cooling disk designed to be cooled with liquid nitrogen or similar refrigerants, allowing for effective cooling of IC devices in contact or proximity. Additionally, his cooling bag is specifically designed to intimately contact the IC device while enclosing a refrigerant. Another version of his testing apparatus features a cooling bag reeved around a drive roller and an idler roller, functioning as a belt conveyor to cool IC devices during transport.
Career Highlights
Throughout his career, Osamu Morioka has worked with prominent companies such as Kabushiki Kaisha Kobe Seiko Sho and Japan LSI Co., Ltd. His experience in these organizations has contributed to his expertise in the field of IC device testing.
Collaborations
Morioka has collaborated with notable coworkers, including Keizo Tokushige and Akeo Kimura. Their joint efforts have likely played a role in advancing the technology related to low-temperature testing of IC devices.
Conclusion
Osamu Morioka's contributions to the field of IC device testing at low temperatures demonstrate his innovative spirit and technical expertise. His patented inventions have the potential to significantly impact the performance evaluation of integrated circuits.