Company Filing History:
Years Active: 2007-2009
Title: Ory Zik: Innovator in Scanning Electron Microscopy
Introduction
Ory Zik is a notable inventor based in Rehovot, Israel. He has made significant contributions to the field of scanning electron microscopy (SEM) with his innovative methods. With a total of 2 patents, Zik continues to push the boundaries of technology in his area of expertise.
Latest Patents
Ory Zik's latest patents focus on methods for SEM inspection of fluid-containing samples. One of his key inventions is a method of visualizing a sample in a wet environment. This involves introducing a sample into a specimen enclosure in a wet environment and scanning the sample in a scanning electron microscope, thereby visualizing the sample effectively.
Career Highlights
Zik is currently associated with Quantomix Ltd., where he applies his expertise in developing advanced imaging techniques. His work has been instrumental in enhancing the capabilities of SEM technology, particularly in handling fluid samples.
Collaborations
Some of Ory Zik's notable coworkers include Vered Behar and Amotz Nechushtan. Their collaborative efforts contribute to the innovative environment at Quantomix Ltd.
Conclusion
Ory Zik's contributions to scanning electron microscopy demonstrate his commitment to innovation and excellence in the field. His patents reflect a deep understanding of the challenges in visualizing samples in wet environments, paving the way for future advancements.
Inventor’s Patent Attorneys refers to legal professionals with specialized expertise in representing inventors throughout the patent process. These attorneys assist inventors in navigating the complexities of patent law, including filing patent applications, conducting patent searches, and protecting intellectual property rights. They play a crucial role in helping inventors secure patents for their innovative creations.