Ory Zik

Title: Ory Zik: Innovator in Scanning Electron Microscopy

Introduction

Ory Zik is a notable inventor based in Tel Aviv, Israel. He has made significant contributions to the field of microscopy, particularly through his innovative patents. With a total of 4 patents, Zik has focused on developing methods and devices that enhance the examination of samples in non-vacuum environments.

Latest Patents

One of Zik's latest patents is a device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope. This invention features a chamber designed for use with a scanning electron microscope, which includes at least one aperture sealed with a membrane. The membrane is engineered to withstand a vacuum while remaining transparent to electrons, ensuring that the interior of the chamber is isolated from the vacuum. This innovative chamber allows for the observation of wet samples, including living cells, under an electron microscope.

Career Highlights

Throughout his career, Ory Zik has worked with several prominent companies, including El-Mul Technologies Ltd and Yeda Research and Development Co. Ltd. His work in these organizations has contributed to advancements in microscopy and sample examination techniques.

Collaborations

Zik has collaborated with notable individuals in his field, including Elisha Moses and Stephan Thiberge. These partnerships have likely fostered innovation and the sharing of ideas, further enhancing the impact of his work.

Conclusion

Ory Zik's contributions to the field of scanning electron microscopy demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in sample examination, paving the way for future advancements in the field.