Company Filing History:
Years Active: 2006-2007
Title: Oleksiy Lopatin: Innovator in Optical Inspection Technologies
Introduction
Oleksiy Lopatin is a notable inventor based in Scarborough, Canada. He has made significant contributions to the field of optical inspection technologies, holding 2 patents that showcase his innovative approach to identifying defects in planar objects.
Latest Patents
Lopatin's latest patents include a method and apparatus for high-throughput inspection of large flat patterned media using dynamically programmable optical spatial filtering. This inspection system utilizes programmable optical Fourier filtering in the focal plane of a telecentric lens system to directly identify physical phenomena indicative of non-periodic defects. The system employs lens assemblies and a coherent optical source to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and alignable spatial light modulator. This spatial light modulator, which boasts a high signal-to-noise ratio, is electrically reconfigurable according to a feedback-driven filter construction and alignment algorithm. The OFF enhances any non-periodic components present in both the Fourier plane and the final image plane of the object. Furthermore, a system with multiple inspection channels allows for high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
Career Highlights
Lopatin is currently employed at Photon Dynamics, Inc., where he continues to develop and refine his innovative technologies. His work has positioned him as a key player in the advancement of optical inspection systems.
Collaborations
Some of his notable coworkers include Adam Weiss and Afsar Saranli, who contribute to the collaborative environment at Photon Dynamics, Inc.
Conclusion
Oleksiy Lopatin's contributions to optical inspection technologies reflect his dedication to innovation and excellence in his field. His patents demonstrate a commitment to enhancing detection methods for non-periodic defects, showcasing the importance of his work in advancing inspection systems.