Palo Alto, CA, United States of America

Oindrila Ray


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Oindrila Ray: Innovator in Semiconductor Technology

Introduction

Oindrila Ray is a prominent inventor based in Palo Alto, CA, known for her contributions to semiconductor technology. She has developed innovative solutions that enhance the performance and reliability of semiconductor devices. Her work is particularly focused on magnetic field shielding, which is crucial for protecting sensitive electronic components.

Latest Patents

Oindrila Ray holds a patent for a "Die surface magnetic field shield." This invention provides a semiconductor topography that includes a magnetic field shield layer formed upon a semiconductor device. The semiconductor topography features a ferromagnetic layer designed to shield underlying layers from external magnetic fields. This layer may consist of either ferrite or non-ferrite materials. In some embodiments, the magnetic field shield layer is patterned differently than an adjacent passivation layer. Additionally, the patent outlines a method for processing a semiconductor topography that includes patterning the magnetic field shield layer to create openings other than bond pad openings.

Career Highlights

Oindrila Ray is currently employed at Silicon Magnetic Systems, where she continues to push the boundaries of semiconductor technology. Her innovative approach and technical expertise have made her a valuable asset to her team and the industry.

Collaborations

Oindrila collaborates with her coworker, Frederick B. Jenne, to further advance their research and development efforts in the field of semiconductor technology.

Conclusion

Oindrila Ray's contributions to semiconductor technology, particularly through her patented innovations, demonstrate her significant impact on the industry. Her work continues to pave the way for advancements in electronic device performance and reliability.

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