Company Filing History:
Years Active: 2012
Title: Ofer Finkler: Innovator in Atomic Force Microscopy
Introduction
Ofer Finkler is a notable inventor based in Atlanta, GA, who has made significant contributions to the field of atomic force microscopy. His innovative work focuses on enhancing the capabilities of imaging probes used in this advanced microscopy technique.
Latest Patents
Finkler holds a patent for "Athermal atomic force microscope probes." This patent describes an atomic force microscopy system that includes an imaging probe with a first thermal displacement constant and a sample placement surface. The design ensures that both the imaging probe and the sample placement surface are displaced by the same distance when subjected to a predetermined temperature, thereby improving measurement accuracy.
Career Highlights
Ofer Finkler is associated with the Georgia Tech Research Corporation, where he continues to push the boundaries of research in microscopy. His work has garnered attention for its potential applications in various scientific fields.
Collaborations
Finkler collaborates with esteemed colleagues such as Hamdi Torun and Fahrettin Levent Degertekin, contributing to a dynamic research environment that fosters innovation.
Conclusion
Ofer Finkler's contributions to atomic force microscopy exemplify the spirit of innovation in scientific research. His patent and ongoing work at Georgia Tech Research Corporation highlight his commitment to advancing technology in this critical field.