Obadiah Reid

Title: Obadiah Reid: Innovator in Sub-Microsecond-Resolution Probe Microscopy

Introduction

Obadiah Reid is a notable inventor based in Denver, CO (US). He has made significant contributions to the field of microscopy, particularly with his innovative approach to time-resolved analysis. His work focuses on understanding the effects of perturbations on samples, which has implications for various scientific applications.

Latest Patents

Obadiah Reid holds a patent for a groundbreaking technology titled "Sub-microsecond-resolution probe microscopy." This patent describes methods and apparatus for time-resolved analysis of the effects of perturbations, such as light or voltage pulses, on a sample. By operating in the time domain, his method enables sub-microsecond time-resolved measurement of transient forces acting on a cantilever. This advancement opens new avenues for research and experimentation in the field.

Career Highlights

Reid is affiliated with the University of Washington, where he continues to push the boundaries of scientific research. His work has garnered attention for its innovative approach and practical applications in microscopy. With a focus on precision and resolution, Reid's contributions are paving the way for future advancements in the field.

Collaborations

Some of his notable coworkers include David S. Ginger and Rajiv Giridharagopal. Their collaborative efforts enhance the research environment and foster innovation within their projects.

Conclusion

Obadiah Reid's work in sub-microsecond-resolution probe microscopy exemplifies the spirit of innovation in scientific research. His contributions are significant and continue to influence the field of microscopy.