Location History:
- Lathrop, CA (US) (2013 - 2015)
- Milpitas, CA (US) (2022)
Company Filing History:
Years Active: 2013-2022
Title: Nyi Nyi Thein: Innovator in Integrated Circuit Testing
Introduction
Nyi Nyi Thein is a notable inventor based in Lathrop, CA (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work focuses on developing techniques and apparatuses that enhance the reliability and efficiency of electronic components.
Latest Patents
One of Nyi Nyi Thein's latest patents is titled "Circuit for detecting pin-to-pin leaks of an integrated circuit package." This invention provides methods for detecting short circuits between pins of an integrated circuit package. The tested pins can be adjacent or non-adjacent, and various types of short circuits, including resistive, diode, and capacitive, can be identified. The test circuit utilizes a current mirror and a comparator to evaluate the voltage of the output path, allowing for effective detection of short circuits.
Another significant patent is the "Memory card test interface." This invention describes a memory card equipped with a test interface that facilitates the simultaneous testing of multiple memory cards. Each card features a serial data I/O contact and a test select contact, enabling efficient data transmission during testing. This design allows for cost-effective testing without the need for additional external circuitry.
Career Highlights
Nyi Nyi Thein is currently employed at SanDisk Technologies Inc., where he continues to innovate in the field of electronic testing. His work has contributed to advancements in the reliability of memory cards and integrated circuits, making a lasting impact on the industry.
Collaborations
Nyi Nyi Thein has collaborated with notable colleagues, including Loc Tu and Charles Moana Hook. Their combined expertise has fostered a productive environment for innovation and development in electronic testing technologies.
Conclusion
Nyi Nyi Thein is a distinguished inventor whose work in integrated circuit testing has led to significant advancements in the field. His patents reflect a commitment to improving the reliability and efficiency of electronic components. Through his contributions, he continues to shape the future of technology.