This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Hammer-Ims. Active years: 2019.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019
Title: Noël Deferm - Innovator in Non-Destructive Characterization
Introduction
Noël Deferm is a notable inventor based in Beverlo, Belgium. He has made significant contributions to the field of sensor technology, particularly in non-destructive characterization of objects. His innovative work has the potential to impact various industries by enhancing inspection processes.
Latest Patents
Noël Deferm holds a patent for a "Sensor for non-destructive characterization of objects." This invention relates to a millimeter or terahertz wave sensor designed for inline inspection. It is particularly useful for continuous monitoring of objects, such as thin sheet dielectric materials. This technology represents a significant advancement in the field of material inspection.
Career Highlights
Deferm is associated with Hammer-IMS, where he applies his expertise in sensor technology. His work at the company has allowed him to develop and refine his innovative ideas, contributing to the advancement of non-destructive testing methods.
Collaborations
Throughout his career, Noël has collaborated with talented individuals such as Tom Redant and Wim Dehaene. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Noël Deferm is a distinguished inventor whose work in sensor technology is paving the way for advancements in non-destructive characterization. His contributions are valuable to the field and demonstrate the importance of innovation in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile