Company Filing History:
Years Active: 1990
Title: The Innovative Contributions of Nick J Bacile
Introduction
Nick J Bacile is a notable inventor based in San Jose, California. He has made significant contributions to the field of radiation detection technology. His work focuses on improving the accuracy of temperature measurements in semiconductor processing.
Latest Patents
Nick J Bacile holds a patent for an "Emissivity correction apparatus and method." This invention pertains to radiation detectors and methods that measure the emissivity of a remote, heated semiconductor wafer in the presence of ambient radiation. The apparatus utilizes incident radiation from a controlled source to intermittently radiate the wafer. Reflected radiation is detected in synchronism with the incident radiation, yielding output indications of the wafer's emissivity under varying processing conditions. Additionally, the temperature of the wafer is monitored by another radiation detector operating within the same selected waveband. The temperature indications are corrected based on the output indications of emissivity, providing accurate readings of the true temperature of the wafer.
Career Highlights
Nick J Bacile is associated with Ag Processing Technologies, Inc., where he applies his expertise in radiation detection technology. His innovative approach has contributed to advancements in semiconductor manufacturing processes.
Collaborations
Nick has collaborated with notable colleagues, including Jaim Nulman and Wendell T Blonigan. Their combined efforts have furthered the development of technologies in their field.
Conclusion
Nick J Bacile's contributions to radiation detection technology exemplify the impact of innovative thinking in the semiconductor industry. His patent and work at Ag Processing Technologies, Inc. highlight the importance of accurate temperature measurement in manufacturing processes.