Sapporo, Japan

Naoki Kamo


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Naoki Kamo: Innovator in Scanning Probe Microscopy

Introduction

Naoki Kamo is a prominent inventor based in Sapporo, Japan. He has made significant contributions to the field of microscopy, particularly through his innovative work on scanning probe microscopes. His research has implications for various scientific disciplines, enhancing our understanding of materials at the nanoscale.

Latest Patents

Naoki Kamo holds a patent for a scanning probe microscope. This advanced device features a probe tip formed from a carbon nanotube with an armchair type crystal structure. Additionally, the forefront of the probe can be chemically modified with specific modifying molecules, allowing for enhanced functionality and precision in imaging.

Career Highlights

Kamo is affiliated with Hokkaido University, where he conducts his research and development activities. His work has positioned him as a key figure in the advancement of microscopy technologies. With a focus on innovative solutions, he continues to push the boundaries of what is possible in scientific imaging.

Collaborations

Naoki Kamo collaborates with esteemed colleagues, including Koichi Mukasa and Kazuhisa Sueoka. These partnerships foster a dynamic research environment, enabling the exchange of ideas and expertise that drive innovation forward.

Conclusion

Naoki Kamo's contributions to the field of scanning probe microscopy exemplify the impact of innovative thinking in science. His work not only advances technology but also opens new avenues for research and discovery.

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