Company Filing History:
Years Active: 2003
Title: Naama Gordon: Innovator in Defect Detection Technology
Introduction
Naama Gordon is a prominent inventor based in Ramat-Efal, Israel. She has made significant contributions to the field of defect detection technology, particularly in the inspection of isolated features on reticles. Her innovative approach has garnered attention in the industry, showcasing her expertise and dedication to advancing technology.
Latest Patents
Naama Gordon holds a patent for a method and apparatus for inspecting isolated features on a reticle. The patent, titled "Defect detection using gray level signatures," describes a process where isolated features are analyzed for defects globally as individual, whole features rather than locally, pixel-by-pixel. The method involves imaging the reticle to produce pixels with gray levels, identifying isolated features, and calculating an energy value by summing the gray levels of the pixels. Additionally, scatter values for the feature are calculated based on its equilibrium center, producing a unique signature for the inspected feature. This signature is then compared with reference features to determine the presence of defects.
Career Highlights
Naama Gordon is currently employed at Applied Materials, Inc., where she continues to develop and refine her innovative technologies. Her work has had a significant impact on the field, and she is recognized for her contributions to improving defect detection methods.
Collaborations
Naama collaborates with her coworker, Gadi Greenberg, who is also a talented professional in the field. Together, they work on advancing technologies that enhance the efficiency and accuracy of defect detection processes.
Conclusion
Naama Gordon's contributions to defect detection technology exemplify her innovative spirit and commitment to excellence. Her patent and ongoing work at Applied Materials, Inc. highlight her role as a key player in the advancement of inspection technologies.