Motohiro Kouno

Title: The Innovations of Motohiro Kouno

Introduction

Motohiro Kouno is a prominent inventor based in Kyoto, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of seven patents. His work focuses on non-destructive measurement techniques that enhance the understanding of electrical characteristics in semiconductors.

Latest Patents

Kouno's latest patents include a method and apparatus for measuring insulation film thickness. This innovative approach utilizes reflectance measurement with two monochromatic light beams of different wavelengths. It allows for the creation of curves that represent the relationship between insulation film thickness and the gap between a test electrode and a semiconductor wafer surface. Additionally, the C-V curve measurement at a fixed gap determines the total capacity of the gap and the insulation film, leading to accurate values for both the gap and insulation film thickness. Another notable patent is a non-destructive measuring sensor for semiconductor wafers. This sensor is designed for easy manufacturing and boasts a high dielectric breakdown strength. It features an electrode mount with a unique electrode pattern and a guard ring to enhance measurement accuracy.

Career Highlights

Throughout his career, Kouno has worked with notable companies such as Dainippon Screen Manufacturing Co., Ltd. His experience in these organizations has contributed to his expertise in semiconductor technology and innovation.

Collaborations

Kouno has collaborated with esteemed colleagues, including Sadao Hirae and Takamasa Sakai. Their joint efforts have further advanced the field of semiconductor measurement techniques.

Conclusion

Motohiro Kouno's contributions to semiconductor technology through his innovative patents and collaborations highlight his importance in the field. His work continues to influence advancements in non-destructive measurement methods for semiconductors.