Portola Valley, CA, United States of America

Moris-Musa Dovek


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Moris-Musa Dovek: Innovator in Scanning Force Microscopy

Introduction

Moris-Musa Dovek is a notable inventor based in Portola Valley, California. He has made significant contributions to the field of microscopy, particularly with his innovative designs that enhance the functionality of scanning force microscopes. His work has implications for various scientific and industrial applications.

Latest Patents

Dovek holds a patent for a "Scanning force microscope having aligning and adjusting means." This invention features a sensor head and a base that houses a moveable sample holder. The sample holder is positioned relative to a probe in the sensor head, allowing for precise monitoring through an optical deflection detection system. This system enables direct visual observation of the probe concerning the sample, enhancing the accuracy of measurements. The design includes a mirror mounted in a cutaway portion of a sphere, which defines the axis of rotation of a kinematic mount, facilitating fine adjustments. The sensor head communicates with the base via a stage kinematic mount, allowing for easy positional adjustments.

Career Highlights

Moris-Musa Dovek has worked at Park Scientific Instruments, a company known for its advancements in scientific instrumentation. His role has allowed him to develop and refine technologies that are crucial for research and development in various fields.

Collaborations

Dovek has collaborated with esteemed colleagues such as Thomas R. Albrecht and Michael D. Kirk. Their combined expertise has contributed to the advancement of technologies in microscopy and related fields.

Conclusion

Moris-Musa Dovek's contributions to the field of scanning force microscopy exemplify the impact of innovative thinking in scientific research. His patent and collaborative efforts continue to influence advancements in microscopy technology.

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