Company Filing History:
Years Active: 2006-2009
Title: Mohsen Abdollahi: Innovator in High-Speed Profilometry
Introduction
Mohsen Abdollahi is a notable inventor based in Huntsville, AL (US). He has made significant contributions to the field of profilometry, particularly through his innovative patents. With a total of 4 patents, Abdollahi has developed advanced techniques that enhance the accuracy and efficiency of surface measurement.
Latest Patents
Abdollahi's latest patents include a high-speed, scanning phase-shifting profilometry system utilizing a 2D CMOS sensor. This system features a high-speed CMOS sensor with more than three rows of pixels, allowing for random accessibility. The sensor is positioned above a workpiece that moves below it, illuminated by a non-uniform light source. This setup enables the registration of non-uniform light reflected from the workpiece, which is then processed by a computer to calculate the surface profile.
Another significant patent involves a scanning 3D measurement technique using structured lighting and a high-speed CMOS imager. This method employs a light source that projects non-uniform illumination patterns. The CMOS sensor, equipped with randomly accessible rows of pixels, captures reflected light from the workpiece, allowing for the calculation of height information. Notably, both 2D and 3D images can be generated during a single scanning pass due to the innovative design of the light source and sensor capabilities.
Career Highlights
Throughout his career, Abdollahi has worked with prominent organizations, including Northrop Grumman Systems Corporation. His experience in these companies has contributed to his expertise in developing cutting-edge technologies in profilometry.
Collaborations
Abdollahi has collaborated with notable professionals in his field, including Kevin H. Giles and Charles L. Guffey. These collaborations have likely enriched his work and led to further advancements in his inventions.
Conclusion
Mohsen Abdollahi stands out as an influential inventor in the realm of high-speed profilometry. His innovative patents and contributions to the field demonstrate his commitment to advancing technology and improving measurement techniques.