Company Filing History:
Years Active: 2025
Title: Innovations by Miriam Van De Stadt-Lagemaat
Introduction
Miriam Van De Stadt-Lagemaat is a notable inventor based in Erlangen, Germany. She has made significant contributions to the field of magnetic resonance systems, particularly in the area of measurement data accuracy. Her innovative approach has led to the development of a patented method that enhances the quality of data captured in magnetic resonance imaging.
Latest Patents
Miriam holds a patent titled "Avoidance of artifacts in measurement data captured using a magnetic resonance system." This patent describes a method for avoiding artifacts in measurement data captured using a magnetic resonance system equipped with a gradient unit. The method involves loading data that characterizes the gradient unit, utilizing a measurement protocol for capturing data, and determining compensation gradients to ensure accurate measurement results.
Career Highlights
Miriam is currently employed at Siemens Healthineers AG, where she applies her expertise in magnetic resonance technology. Her work focuses on improving measurement techniques and ensuring the reliability of data captured during medical imaging procedures. With one patent to her name, she has established herself as a valuable contributor to her field.
Collaborations
Miriam has collaborated with colleagues such as Adam Kettinger and Flavio Carinci, working together to advance the technology and methodologies used in magnetic resonance systems. Their combined efforts aim to enhance the effectiveness of medical imaging and improve patient outcomes.
Conclusion
Miriam Van De Stadt-Lagemaat's innovative work in the field of magnetic resonance imaging exemplifies the impact of dedicated inventors on medical technology. Her contributions continue to shape the future of imaging techniques, ensuring better accuracy and reliability in patient diagnostics.