Company Filing History:
Years Active: 2024
Title: Minho Rim: Innovator in Through-Focus Image-Based Metrology
Introduction: Minho Rim, based in Hwaseong-si, South Korea, is an accomplished inventor known for his contributions to metrology through innovative technology. His expertise in imaging and measurement systems has led to the development of a significant patent that enhances precision in various applications.
Latest Patents: Minho Rim holds a patent for a "Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation." This invention encompasses an advanced metrology device that integrates an optical system with a computing mechanism designed to acquire through-focus images of a target. By generating an intensity profile from these images, the device performs accurate measurements, which are crucial for quality control in manufacturing processes. The optical device includes a stage for the target, an image sensor, an objective lens, and a light source to facilitate the imaging process.
Career Highlights: Minho Rim has made notable advancements in the field of metrology while working at Samsung Electronics Co., Ltd. His work reflects a commitment to pushing the boundaries of technology in measuring optical characteristics with high precision. This dedication has positioned him as a key player in the development of imaging technologies.
Collaborations: Minho Rim collaborates with colleagues such as Sungyoon Ryu, fostering a dynamic environment of innovation. Together, they contribute to the advancements in optical measurement systems, leveraging their combined expertise to address complex engineering challenges.
Conclusion: Minho Rim exemplifies the spirit of innovation in the realm of measurement technology. His patent on a through-focus image-based metrology device underscores his role in enhancing the capabilities of optical systems. As technology progresses, the contributions of inventors like Minho Rim will be pivotal in shaping the future of precision measurement.