Ming-Xuan Weng

Title: Innovations of Ming-Xuan Weng in Three-Dimensional Profilometry

Introduction

Ming-Xuan Weng is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of three-dimensional profilometry, showcasing his expertise through innovative patent developments. His work focuses on enhancing measurement techniques for object surfaces, which has implications in various scientific and industrial applications.

Latest Patents

Ming-Xuan Weng holds a patent for a "Measuring apparatus for three-dimensional profilometry and method thereof." This invention provides a sophisticated measuring apparatus and method that utilizes a random-speckle beam and a structured fringe beam. These beams are projected onto an object and reflected back, allowing for the acquisition of deformed random-speckle and structured fringe images. The technology enables the determination of absolute and relative phase information for each position on the object's surface, ultimately leading to the calculation of depth information and the establishment of the surface profile.

Career Highlights

Ming-Xuan Weng is affiliated with National Taiwan University, where he continues to engage in research and development in the field of profilometry. His work not only contributes to academic knowledge but also has practical applications in various industries that require precise surface measurements.

Collaborations

Ming-Xuan Weng collaborates with esteemed colleagues such as Liang-Chia Chen and Chung-An Hsieh. Their combined expertise fosters an environment of innovation and advancement in their research endeavors.

Conclusion

Ming-Xuan Weng's contributions to three-dimensional profilometry through his innovative patent highlight his role as a leading inventor in this field. His work continues to influence measurement techniques and applications across various sectors.