Location History:
- Tochigi, JP (1994)
- Otawara, JP (2015 - 2021)
Company Filing History:
Years Active: 1994-2021
Title: Mikihito Hayashi: Innovator in Photon Counting Technology
Introduction
Mikihito Hayashi is a prominent inventor based in Otawara, Japan. He has made significant contributions to the field of medical imaging technology, particularly in photon counting detectors. With a total of 9 patents to his name, Hayashi's work has advanced the capabilities of X-ray computed tomography.
Latest Patents
Hayashi's latest patents include a sensitivity correction method and a photon counting detector. According to one embodiment, the sensitivity correction method involves acquiring count rates for respective pixels in a photon counting detector. It also includes preparing incident dose adjustment materials for the respective pixels based on these count rates and providing these materials on the surface of the photon counting detector. Another notable patent is for an X-ray computed tomography apparatus and X-ray detector. This apparatus features an X-ray tube that generates X-rays and a detector with two detection areas. The first detection area includes a scintillator with a longer fluorescence decay time, while the second detection area has a shorter decay time and is arranged at both ends of the first detection area.
Career Highlights
Throughout his career, Mikihito Hayashi has worked with leading companies in the medical technology sector. He has been associated with Toshiba Medical Systems Corporation and Canon Medical Systems Corporation, where he has contributed to the development of advanced imaging technologies.
Collaborations
Hayashi has collaborated with notable professionals in his field, including Tooru Kato and Hiroaki Nakai. Their joint efforts have furthered innovations in medical imaging and photon counting technologies.
Conclusion
Mikihito Hayashi's contributions to the field of medical imaging through his patents and collaborations highlight his role as a key innovator. His work continues to influence advancements in photon counting technology and X-ray imaging systems.