Madrid, Spain

Miguel Roca García

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ust Global Inc. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miguel Roca García. Retrieved from https://idiyas.com/inventor/miguel-roca-garcía

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Miguel Roca García: Document Classification Innovation

Introduction

Miguel Roca García is an inventor based in Madrid, Spain. His patent work addresses document classification for straight-through processing, a process designed to handle documents with minimal manual intervention. He is associated with UST Global Inc.

Latest Patents

Roca García is credited with 1 patent: “Method of Classifying a Document for a Straight-Through Processing.” The invention uses memory-enabled modeling to process an input image, extract its content, and select the most likely matching template from a database. It then postprocesses the extracted content according to the predicted template and validates the results. The document is classified for straight-through processing when the relevant image-quality, refined-content-extraction, and layout validations succeed.

Career Highlights

The patent reflects an approach to automating document workflows through template matching, content extraction, and validation. These steps are intended to support reliable classification while reducing the need for manual processing.

Collaborations

His listed coworkers include Dasaprakash Krishnamurthy and José Pablo Romero Valle. The available information identifies these professional connections but does not specify their roles in the patent.

Conclusion

Miguel Roca García’s documented invention focuses on improving automated document classification through modeling and layered validation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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