Epalinges, Switzerland

Michel Bonzon



Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Michel Bonzon - Innovator in X-ray Analysis Technology

Introduction

Michel Bonzon is a notable inventor based in Epalinges, Switzerland. He has made significant contributions to the field of X-ray analysis, particularly through his innovative patent for an X-ray analysis instrument. His work has implications for various scientific and industrial applications.

Latest Patents

Michel Bonzon holds a patent for an X-ray analysis instrument, which is designed to perform both X-ray diffraction (XRD) and X-ray fluorescence (XRF) analysis of crystalline samples. The apparatus features a sample holder located within an evacuable chamber. It includes both an X-ray fluorescence source and a separate X-ray diffraction source mounted within the chamber. The instrument is equipped with an XRF detection arrangement to detect secondary X-rays emitted from the crystalline sample's surface when illuminated by X-rays. Additionally, an XRD detection arrangement is provided to detect X-rays of a characteristic wavelength that have been diffracted by the sample. A moveable XRD support assembly allows for relative movement between the XRD source and the sample holder, enhancing the instrument's functionality.

Career Highlights

Michel Bonzon is associated with Thermo Fisher Scientific GmbH, where he continues to advance his research and development efforts in X-ray analysis technology. His work has positioned him as a key figure in the field, contributing to the development of sophisticated analytical instruments.

Collaborations

Throughout his career, Michel has collaborated with talented professionals, including Ravisekhar Yellepeddi and Pierre-Yves Negro. These collaborations have fostered innovation and have been instrumental in the advancement of their shared projects.

Conclusion

Michel Bonzon's contributions to X-ray analysis technology through his innovative patent demonstrate his expertise and commitment to advancing scientific instrumentation. His work continues to impact various fields, showcasing the importance of innovation in technology.

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