Company Filing History:
Years Active: 2001
Title: Michael Wc Huang: Innovator in Semiconductor Testing
Introduction
Michael Wc Huang is a notable inventor based in Taipei Hsien, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of testing leakage currents in self-aligned silicide processes. His innovative approach has the potential to enhance the reliability and performance of metal-oxide semiconductor transistors.
Latest Patents
Huang holds a patent titled "Method for testing leakage current caused self-aligned silicide." This invention describes a method for testing leakage currents that arise during the self-aligned silicide process. The patent outlines a unique test structure that monitors the degree and reasons for leakage currents, providing insights into the performance of metal-oxide semiconductor transistors. The invention takes into account various factors contributing to leakage currents, including those from the metal silicide layer to the junction and at the edges of the metal silicide layer.
Career Highlights
Throughout his career, Michael Wc Huang has demonstrated a commitment to advancing semiconductor technology. His work has focused on improving the understanding of leakage currents, which are critical for the performance of modern electronic devices. Huang's innovative methods have garnered attention in the industry, showcasing his expertise and dedication to research and development.
Collaborations
Huang has collaborated with esteemed colleagues such as Gwo-Shii Yang and Hsiao-Ling Lu. These partnerships have contributed to the advancement of semiconductor testing methodologies and have fostered a collaborative environment for innovation.
Conclusion
Michael Wc Huang is a distinguished inventor whose work in semiconductor testing has made a significant impact on the industry. His patent on testing leakage currents exemplifies his innovative spirit and dedication to enhancing technology. Huang's contributions continue to influence the field, paving the way for future advancements in semiconductor design and testing.