Location History:
- Downers Grove, IL (US) (1997 - 2003)
- Batavia, IL (US) (1997 - 2017)
Company Filing History:
Years Active: 1997-2017
Title: Innovations of Michael J Mulrooney
Introduction
Michael J Mulrooney is a notable inventor based in Batavia, IL (US). He has made significant contributions to the field of measurement systems, holding a total of five patents. His work primarily focuses on developing innovative solutions for level measurement in various applications.
Latest Patents
One of his latest patents is a redundant level measuring system. This system comprises a chamber for fluidic coupling to a process vessel, allowing the material level in the vessel to equalize with the material level in the chamber. A float, which includes a magnet, rises and falls with the material level in the chamber. A magnet actuated visual indicator is mounted to the chamber to indicate the level of the magnet. Additionally, a measurement instrument with an antenna and a measurement circuit is mounted atop the chamber, measuring the time of flight of a through-air signal that represents the level of the material in the chamber. A shield in the chamber isolates the float from the antenna. Another version of the redundant level measuring system features a probe instead of an antenna, measuring a characteristic of the probe to represent the level of the material in the chamber.
Career Highlights
Michael J Mulrooney is currently employed at Magnetrol International, Inc., where he continues to innovate and develop advanced measurement technologies. His expertise in level measurement systems has positioned him as a key player in the industry.
Collaborations
Throughout his career, Mulrooney has collaborated with talented individuals such as Boyce M Carsella and Don Patrick Sanders. These collaborations have contributed to the advancement of measurement technologies and the successful development of innovative products.
Conclusion
Michael J Mulrooney's contributions to the field of level measurement systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in measurement technology and provide effective solutions for various applications.