Michael J Haugh

Title: Michael J Haugh: Innovator in X-ray Emission Technology

Introduction

Michael J Haugh is a notable inventor based in Livermore, California. He has made significant contributions to the field of x-ray emission technology. His innovative work has led to the development of a unique system that enhances the characterization of x-ray emitting events.

Latest Patents

Haugh holds a patent for "Crystals for krypton helium-alpha line emission microscopy." This invention describes a system designed to reflect and record x-ray radiation from an x-ray emitting event. The system utilizes a crystal aligned to receive radiation along a first path from the event. Upon striking the crystal, the x-ray reflects along a second path due to a reflection plane defined by specific Miller indices. The exemplary crystalline material used in this invention is germanium. The reflected x-rays are directed to a detector, which generates a signal in response to the x-rays impacting it. This signal is then processed to generate reflection data representing the emitted x-rays.

Career Highlights

Michael J Haugh is currently employed at National Security Technologies LLC. His work at this organization focuses on advancing technologies related to national security and x-ray emission systems. Haugh's expertise in this area has positioned him as a valuable asset to his team.

Collaborations

Haugh collaborates with Jeffrey A Koch, who is also involved in similar technological advancements. Their partnership contributes to the innovative projects at National Security Technologies LLC.

Conclusion

Michael J Haugh's contributions to x-ray emission technology exemplify the impact of innovation in scientific research. His patent and work at National Security Technologies LLC highlight his commitment to advancing this critical field.