Company Filing History:
Years Active: 1999
Title: Michael Holtzman: Innovator in Wafer Position Error Detection
Introduction
Michael Holtzman, an innovative inventor located in Kfar Saba, IL, has made a significant contribution to the field of semiconductor manufacturing through his patented technology. His work primarily focuses on systems that enhance the accuracy and efficiency of wafer handling processes.
Latest Patents
Holtzman holds a patent for a "Wafer Position Error Detection and Correction System." This advanced system is designed to determine the presence of a wafer on a wafer transport robot blade. It effectively monitors the wafer's position in relation to the blade using sensors positioned near the entrance of a process chamber. When a misalignment is detected, the system not only identifies the extent of the error but also corrects it if possible, or alerts an operator for manual intervention. This innovation includes transparent covers and optical detection sensors that ensure precise alignment, contributing to improved operational efficiency in wafer handling.
Career Highlights
Michael Holtzman is affiliated with Applied Materials, Inc., a leading company in the field of semiconductor equipment and services. His role at Applied Materials has enabled him to further hone his skills in innovation and technology development, contributing to cutting-edge solutions within the industry.
Collaborations
Throughout his career, Holtzman has collaborated with notable colleagues such as Frederik W. Freerks and Lloyd M. Berken. These partnerships underscore the importance of teamwork in fostering innovation and advancing technological solutions in the challenging landscape of semiconductor manufacturing.
Conclusion
Michael Holtzman’s contributions to wafer handling technology demonstrate the impactful role of inventors in enhancing industrial processes. His patented system for wafer position error detection marks a significant advancement in the field, highlighting how innovation can lead to greater accuracy and efficiency in manufacturing environments.