Company Filing History:
Years Active: 2025
Title: Meryll Dindin: Innovator in Abnormality Determination Technology
Introduction
Meryll Dindin is a prominent inventor based in Palaiseau, France. She has made significant contributions to the field of technology, particularly in the area of abnormality determination methods. Her innovative work has led to the development of a unique patent that addresses critical challenges in data analysis.
Latest Patents
Meryll Dindin holds a patent for a "Computer-readable recording medium, abnormality determination method, and abnormality determination device." This invention involves a learning device that utilizes an autoencoder to perform learning with waveform data that changes over time, derived from the intrinsic movement of an object. The device employs persistent homology conversion to assess changes in the number of connected components based on varying thresholds of the first waveform data. Ultimately, the learning device determines abnormalities by analyzing output data from the autoencoder and the persistent homology conversion, which has undergone machine learning regarding the waveform data's abnormality.
Career Highlights
Meryll Dindin is currently employed at Fujitsu Corporation, where she continues to advance her research and development efforts. Her work is instrumental in enhancing the capabilities of learning devices in identifying abnormalities, which has significant implications for various industries.
Collaborations
Meryll collaborates with notable colleagues, including Yuhei Umeda and Frederic Chazal. Their combined expertise fosters an environment of innovation and progress in their respective fields.
Conclusion
Meryll Dindin's contributions to technology through her patent and work at Fujitsu Corporation exemplify her role as a leading inventor in abnormality determination methods. Her innovative spirit continues to drive advancements in data analysis and machine learning.