Company Filing History:
Years Active: 2003
Title: Meny Shy - Innovator in Optical Metrology
Introduction
Meny Shy is a notable inventor based in Aminadav, Israel. He has made significant contributions to the field of optical metrology, particularly through his innovative patent that enhances light detection methods.
Latest Patents
Meny Shy holds a patent titled "Polarized illumination and detection for metrological applications." This invention describes an apparatus and method designed to improve the proportion of detected light that has been diffusely scattered by a surface, as opposed to light that is specularly reflected from that surface. The system utilizes a beam of light with a predominant polarization direction, which is directed through a wedge module to illuminate the scene. The wedge module consists of two optically anisotropic wedges and an optical compensation plate. The polarization axes of these wedges are aligned with the direction of the predominant polarization of the illuminating beam. Light that is scattered by the surface is then detected through a polarizer.
Career Highlights
Meny Shy is currently employed at Optimet, Optical Metrology Ltd., where he applies his expertise in optical technologies. His work focuses on advancing metrological applications through innovative solutions.
Collaborations
Meny has collaborated with notable colleagues, including Gabriel Y Sirat and Yaacov Zerem, contributing to various projects within the field of optical metrology.
Conclusion
Meny Shy is a distinguished inventor whose work in polarized illumination and detection has the potential to significantly impact metrological applications. His contributions to optical metrology reflect his commitment to innovation and excellence in the field.