Company Filing History:
Years Active: 2017
Title: Innovations of Meng-Hsiu Li in Optical Interferometry
Introduction
Meng-Hsiu Li is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of optical interferometry, particularly in the area of thickness inspection. His innovative approach has led to advancements that enhance measurement accuracy and efficiency.
Latest Patents
Meng-Hsiu Li holds a patent for an "Optical interferometric apparatus for real-time full-field thickness inspection and method thereof." This device utilizes an optical interferometric technique to perform real-time thickness inspections. The method allows for non-contact and non-destructive measurements, which are crucial in various applications. By radiating an optical spherical wavefront at an oblique angle, the device captures an interference fringe pattern that directly correlates with the thickness distribution of the object being measured. This invention enables rapid online thickness inspection without the need for optical lens groups or special optical elements.
Career Highlights
Meng-Hsiu Li is affiliated with Tsinghua University, where he continues to engage in research and development in optical technologies. His work has garnered attention for its practical applications in industrial settings, particularly in quality control processes.
Collaborations
Meng-Hsiu Li has collaborated with notable colleagues, including Wei-Chung Wang and Chi-Hung Huang. These partnerships have fostered a collaborative environment that promotes innovation and the sharing of ideas in the field of optical engineering.
Conclusion
Meng-Hsiu Li's contributions to optical interferometry exemplify the impact of innovative thinking in technology. His patented inventions not only advance measurement techniques but also pave the way for future developments in the field.