Company Filing History:
Years Active: 2017
Title: Mayumi Naito: Innovator in Defect Inspection Technology
Introduction
Mayumi Naito is a prominent inventor based in Kawasaki, Kanagawa, Japan. She has made significant contributions to the field of defect inspection technology, showcasing her expertise through her innovative patent.
Latest Patents
Naito holds a patent for a defect inspection method. This method involves exposing a target object to a tracer that has higher absorptance for a neutron ray than the target object itself. The process includes radiating the neutron ray to the target object, generating at least one neutron image based on the neutron ray that has penetrated the target object, and detecting defects based on the generated neutron image. This innovative approach enhances the accuracy of defect detection in various applications.
Career Highlights
Mayumi Naito is associated with Kabushiki Kaisha Toshiba, a leading technology company. Her work at Toshiba has allowed her to develop and refine her patented technology, contributing to advancements in the field of inspection methods.
Collaborations
Naito collaborates with talented individuals such as Akira Tanaka and Masaya Hirashima. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Mayumi Naito's contributions to defect inspection technology exemplify her dedication to innovation. Her patent and work at Toshiba highlight her role as a leading inventor in her field.