Company Filing History:
Years Active: 2001
Title: Max Guest - Innovator in Optical Inspection Technology
Introduction
Max Guest is a notable inventor based in Plano, Texas. He has made significant contributions to the field of optical inspection technology, particularly in the semiconductor industry. His innovative approach has led to the development of a unique system that enhances the inspection process of surface structures on various objects.
Latest Patents
Max Guest holds a patent for a "System and method of optically inspecting surface structures on an object." This invention provides a platform that supports the object under examination, utilizing lights or other energy sources for optimal illumination. The system achieves optimum lighting by orienting two opposing lateral energy sources to direct energy along the surface at a very low angle. Additionally, a coaxial light source emits energy directed downward toward the surface. The energy reflected back is captured as an image by a device such as a CCD camera. The lighting can be controlled by an attached computer, which processes, stores, and analyzes the captured images to detect and categorize defects in the inspected object. Max Guest's patent is a testament to his innovative spirit and technical expertise.
Career Highlights
Max Guest has dedicated his career to advancing optical inspection technologies. His work at Isoa, Inc. has positioned him as a key player in the industry. With a focus on improving inspection methods, he has contributed to the development of systems that enhance the accuracy and efficiency of defect detection in semiconductor wafers.
Collaborations
Max has collaborated with talented individuals such as Youling Lin and Charles Harris. Their combined expertise has fostered an environment of innovation and creativity, leading to advancements in optical inspection technologies.
Conclusion
Max Guest's contributions to the field of optical inspection technology are noteworthy. His innovative patent and collaborative efforts have significantly impacted the semiconductor industry. His work continues to inspire advancements in inspection methods, ensuring higher quality standards in manufacturing processes.