Company Filing History:
Years Active: 2013-2016
Title: Innovations by Matthew Lindsey
Introduction
Matthew Lindsey is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of non-destructive measurement technologies. With a total of 2 patents, Lindsey has demonstrated his expertise and innovative spirit in developing advanced measurement techniques.
Latest Patents
One of Lindsey's latest patents is a method and apparatus for nondestructive measuring of a coating thickness on a curved surface. This invention provides an improved method for non-destructive measurements by utilizing components of microwave energy reflected from the surface. The preferred embodiments include a portable microwave thickness detector with a rounded rocker-type base, allowing the microwave beam to be adjusted through various angles relative to the target surface. An optical alignment system is integrated to determine when the microwave angle of incidence is at the desired angle for accurate measurement of the reflected microwave energy. Additionally, this portable microwave thickness detector maintains a constant standoff distance between the microwave detector and the sample being measured.
Career Highlights
Matthew Lindsey is associated with Systems & Materials Research Corporation, where he continues to innovate and develop new technologies. His work focuses on enhancing measurement techniques that are crucial for various applications in industry.
Collaborations
Lindsey collaborates with notable professionals in his field, including his coworker Alan V Bray. Their combined expertise contributes to the advancement of measurement technologies.
Conclusion
Matthew Lindsey's contributions to non-destructive measurement technologies highlight his innovative capabilities and commitment to advancing the field. His patents reflect a deep understanding of the challenges in measurement techniques and provide practical solutions for industry applications.