Boulder Creek, CA, United States of America

Matthew Fauss


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovations of Matthew Fauss

Introduction

Matthew Fauss is an accomplished inventor based in Boulder Creek, California. He has made significant contributions to the field of measurement technology, particularly in the area of film thickness measurement. His innovative approach combines advanced sensor technology with practical applications in various industries.

Latest Patents

Matthew Fauss holds a patent for an "Apparatus and method of using impedance resonance sensor for thickness measurement." This invention provides a method for measuring film thickness on an underlying body using an Impedance Resonance (IR) sensor. The apparatus includes a sensing head with an inductor that features both an excitation coil and a sensing coil. The excitation coil propagates energy to the sensing coil, generating a probing electromagnetic field. The system also incorporates a power supply, an RF sweep generator, a data acquisition block, a calculation block, and a communication block. This technology is applicable for monitoring the thickness of conductive, semiconductive, or non-conductive films, and it supports various tools for Chemical Mechanical Polishing/Planarization (CMP), etching, deposition, and stand-alone metrology.

Career Highlights

Matthew Fauss has established himself as a key figure in the field of measurement technology. His work at Neovision, LLC has allowed him to develop and refine his innovative ideas. With a focus on practical applications, he has contributed to advancements that benefit multiple industries.

Collaborations

Matthew collaborates with Yury Nikolenko, working together to push the boundaries of measurement technology. Their combined expertise fosters an environment of innovation and creativity.

Conclusion

Matthew Fauss is a notable inventor whose work in impedance resonance sensors has the potential to revolutionize film thickness measurement. His contributions to Neovision, LLC and collaboration with Yury Nikolenko highlight his commitment to advancing technology in this field.

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