Eisenberg, Germany

Matthais Loeffler


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):

Title: **Matthais Loeffler: Innovating Probe Processing Technologies**

Introduction

Matthais Loeffler is a notable inventor based in Eisenberg, Germany. He has made significant contributions to the field of probe processing equipment, particularly through his innovative patent which enhances the precision of probe positioning.

Latest Patents

Loeffler holds a patent titled "Method and apparatus for controlling the position of a probe location relative to a fixed reference point of a probe processing apparatus." This invention describes a method for controlling the position of a probe location that falls within a predetermined converging range of a laser beam emitted by an optical laser apparatus. The process involves splitting the positioning laser beam into a probe beam and a reference beam, which are polarized differently. By detecting the phase difference between the reference beam and the reflected probe beam, adjustments can be made to the supporting table of the probe processing apparatus to minimize this phase difference.

Career Highlights

Matthais Loeffler has made a mark in the technology sector through his association with International Business Machines Corporation (IBM). His work focuses on enhancing the capabilities of probe processing equipment, which is crucial for various technological applications.

Collaborations

Loeffler collaborates with colleagues such as Gernot Brasen and Heiko Theuer. These collaborations highlight the teamwork and synergy in achieving innovative solutions within IBM’s research and development environment.

Conclusion

Through his inventive methodologies, Matthais Loeffler continues to contribute to advancements in probe processing technology. His patent serves as a testament to his ingenuity and dedication to innovation in engineering. As technology progresses, his work may lead to further advancements that improve the efficiency and accuracy of probe processing systems.

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