Location History:
- Nagasaki, JP (2017)
- Tokyo, JP (2015 - 2020)
Company Filing History:
Years Active: 2015-2020
Title: Masashi Hayashi: Innovator in Monitoring Systems and Wafer Inspection Technologies
Introduction
Masashi Hayashi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of monitoring systems and wafer inspection technologies. With a total of 6 patents to his name, Hayashi's work reflects a commitment to advancing technology in these areas.
Latest Patents
Hayashi's latest patents include a switch system and a monitoring centralized control method. The switch system allows for the free change of a grain degree of monitoring without the need for conscious routing control. This innovation utilizes a control protocol based on the OpenFlow technique to manage the monitoring function of the switch system. It enables centralized control of monitoring across the entire network, with the monitoring results influencing routing control. The switch features a flow table for packet transfer and another for monitoring, allowing for efficient multi-hit operations on packets.
Another notable patent is the wafer defect inspection apparatus and method. This invention determines whether the average gray level of an image of a wafer, which is the inspection target, falls within a defect detectable range. If the average gray level is not in the detectable range, the control processing unit modifies the exposure time for imaging the wafer and captures a new image. The image processing unit then conducts a defect inspection based on the newly obtained image if it is within the detectable range.
Career Highlights
Throughout his career, Masashi Hayashi has worked with notable companies such as NEC Corporation and Sumco Corporation. His experience in these organizations has contributed to his expertise in developing innovative technologies.
Collaborations
Hayashi has collaborated with several professionals in his field, including Masanori Takashima and Tetsu Izawa. These collaborations have likely enriched his work and led to further advancements in his inventions.
Conclusion
Masashi Hayashi's contributions to monitoring systems and wafer inspection technologies highlight his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of complex systems and a commitment to improving efficiency in these critical areas.