Location History:
- Nagoya, JP (2001)
- Zama, JP (2003)
Company Filing History:
2 out of 832,880 Years Active: 2001-2003
Title: Masahiro Inoue: Innovator in Charged Particle Beam Systems
Introduction
Masahiro Inoue is a prominent inventor based in Zama, Japan. He has made significant contributions to the field of charged particle beam systems, holding a total of 2 patents. His innovative work has advanced the technology used in various applications, showcasing his expertise and creativity.
Latest Patents
Inoue's latest patents include a "Charged Particle Beam System" and a "Pattern Slant Observing Method." The charged particle beam system comprises a charged beam source, a condenser lens, a scanning deflecting device, an objective lens, and a secondary electron detector. It features a slant observing deflecting device that deflects charged particle beams just before they reach the sample surface, allowing for slanting incidence. The deflection angle is controlled by a DC current input to the device, ensuring precise control over the irradiation position shift. His second patent, the coating apparatus, includes a robot with a movable portion and a pressurized chamber, along with a coating device that features a coating gun and a paint feed pump.
Career Highlights
Throughout his career, Masahiro Inoue has demonstrated a commitment to innovation and excellence in his field. His patents reflect a deep understanding of the complexities involved in charged particle beam technology and its applications.
Collaborations
Inoue has collaborated with notable coworkers, including Hideaki Abe and Yuichiro Yamazaki. Their combined expertise has contributed to the successful development of advanced technologies in their respective fields.
Conclusion
Masahiro Inoue's contributions to the field of charged particle beam systems highlight his innovative spirit and technical prowess. His patents not only advance technology but also pave the way for future developments in the industry.