Reading, MA, United States of America

Mary C Stock


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:

goldMedal1 out of 832,680 
Other
 patents

Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Mary C Stock: Innovator in Semiconductor Testing Technology

Introduction

Mary C Stock is a notable inventor based in Reading, MA (US). She has made significant contributions to the field of semiconductor testing, particularly with her innovative approach to integrated circuits. Her work has paved the way for advancements in testing methodologies that enhance efficiency and accuracy.

Latest Patents

Mary C Stock holds a patent for a "Test system for integrated circuits using a single memory for both the scan test mode and the parallel test mode." This semiconductor test system utilizes a single memory that maximizes its storage capacity to store both parallel test vectors and scan test vectors. The design includes a switch to transition between test modes, and a pattern generator that manipulates the test vectors to improve testing speed. The system also incorporates multiple scan chains to reduce processing time and enhances data transfer speeds through multiplexing.

Career Highlights

Throughout her career, Mary has demonstrated a commitment to innovation in semiconductor technology. Her patent reflects her deep understanding of the complexities involved in integrated circuit testing. She has been instrumental in developing systems that not only streamline the testing process but also improve the reliability of semiconductor devices.

Collaborations

Mary has worked alongside esteemed colleagues such as Raymond L Strouble and Ernest P Walker. Their collaborative efforts have contributed to the advancement of testing technologies in the semiconductor industry.

Conclusion

Mary C Stock's contributions to semiconductor testing technology exemplify her innovative spirit and dedication to improving industry standards. Her patent showcases her ability to solve complex problems and enhance testing efficiency.

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