Marton O Harms

Title: Marton O Harms: Innovator in X-ray Examination Technology

Introduction

Marton O Harms is a notable inventor based in Hengelo, Netherlands. He has made significant contributions to the field of medical imaging, particularly through his innovative patent related to X-ray examination apparatus.

Latest Patents

Marton O Harms holds a patent for an X-ray examination apparatus featuring an advanced imaging arrangement. This arrangement includes a multi-sensor that combines several partially overlapping sub-images. The result is an increased effective sensor area compared to a single sensor image. This technology is particularly suitable for imaging large area output screens of image intensifiers using semiconductor image sensors. The patent also addresses image artifacts caused by alignment variations among the image sensors by applying geometric transformations to the electronic sub-images generated. The transformed sub-images are then assembled into a recombined image, with further quality improvements achieved through evening operations in overlapping regions.

Career Highlights

Marton O Harms is associated with U.S. Philips Corporation, where he has contributed to advancements in imaging technology. His work has been instrumental in enhancing the quality and efficiency of X-ray examinations.

Collaborations

Marton has collaborated with notable colleagues, including Cornelis H Slump and Geert Jan Laanstra, who have also contributed to the field of medical imaging.

Conclusion

Marton O Harms is a distinguished inventor whose work in X-ray examination technology has paved the way for improved medical imaging solutions. His innovative approach continues to influence the field positively.