's-Gravenzande, Netherlands

Martinus Cornelius Johannes Maria Van Riel

USPTO Granted Patents = 4 

 

Average Co-Inventor Count = 4.4

ph-index = 1


Company Filing History:


Years Active: 2021-2022

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4 patents (USPTO):Explore Patents

Sure, here is the article about the inventor Martinus Cornelius Johannes Maria Van Riel:

Title: Innovator Profile: Martinus Cornelius Johannes Maria Van Riel

Introduction:

Martinus Cornelius Johannes Maria Van Riel is a renowned inventor based in 's-Gravenzande, Netherlands, with a significant contribution to the field of subsurface atomic force microscopy. With a passion for innovation and cutting-edge technology, Van Riel has made remarkable advancements in the field of microscopy.

Latest Patents:

1. **Frequency tracking for subsurface atomic force microscopy**: Van Riel's patented method and system for subsurface atomic force microscopy enable precise measurements at the nanoscale level. The system includes advanced technologies such as signal sources, transducers, and cantilever tips for accurate subsurface feature detection.

2. **Scanning probe microscopy system for mapping nanostructures**: His invention of a scanning probe microscopy system allows for mapping nanostructures on sample surfaces with high precision. The system incorporates a scan head, optical source, and sensor unit to capture detailed information about the sample's surface.

Career Highlights:

Van Riel is associated with the leading research institution "Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek TNO" where he has brought his visionary ideas to life. His expertise in subsurface imaging and nanostructure mapping has significantly advanced the field of microscopy.

Collaborations:

Throughout his career, Van Riel has collaborated with esteemed colleagues such as Hamed Sadeghian Marnani and Paul Louis Maria Joseph Van Neer. Together, they have worked on groundbreaking projects, pushing the boundaries of scientific research and technological innovation.

Conclusion:

Inventor Martinus Cornelius Johannes Maria Van Riel's relentless pursuit of excellence and passion for discovery have established him as a key figure in the world of microscopy. His patented technologies have opened new possibilities in subsurface imaging and nanostructure mapping, contributing to the advancement of scientific knowledge and technological innovation.

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