Lincoln, CA, United States of America

Martin A Josefowicz


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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2 patents (USPTO):Explore Patents

Title: Innovations by Martin A Josefowicz

Introduction

Martin A Josefowicz is an accomplished inventor based in Lincoln, CA. He has made significant contributions to the field of measurement technology, particularly in the area of substrate thickness measurement. With a total of two patents to his name, Josefowicz continues to push the boundaries of innovation.

Latest Patents

Josefowicz's latest patents focus on advanced methods for measuring the thickness of substrates using color metrology. One of his patents describes a layer thickness measurement system that includes a support to hold a substrate, an optical sensor to capture a color image of at least a portion of the substrate, and a controller. The controller is designed to receive the color image from the optical sensor, perform color correction to enhance color contrast, and determine pixel coordinates in a multi-dimensional color space. This system calculates a value representative of thickness based on the pixel coordinates. Another patent outlines a similar system, where the controller stores a function that provides a thickness value as a function of position along a predetermined path. This innovation allows for precise thickness measurements by determining the closest point on the path to the pixel coordinates.

Career Highlights

Martin A Josefowicz is currently employed at Applied Materials, Inc., a leading company in the field of materials engineering. His work at Applied Materials has allowed him to develop and refine his innovative measurement technologies, contributing to advancements in various applications.

Collaborations

Josefowicz has collaborated with notable colleagues, including Nojan Motamedi and Dominic J Benvegnu. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Martin A Josefowicz is a prominent inventor whose work in substrate thickness measurement has the potential to revolutionize the industry. His innovative patents and contributions to Applied Materials, Inc. highlight his commitment to advancing technology.

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