Mark W Maloney

Title: Mark W Maloney: Innovator in Delay Line Linearity Testing

Introduction

Mark W Maloney is a notable inventor based in Sunnyvale, CA (US). He has made significant contributions to the field of testing methodologies, particularly in the area of delay line linearity testing. His innovative approach has streamlined processes and improved measurement accuracy.

Latest Patents

Mark W Maloney holds a patent for a "Method for delay line linearity testing." This invention provides both differential and integral non-linearity measurement capabilities with a minimum of additional hardware. It also significantly reduces test time by several orders of magnitude. The test circuit for multiple delay lines includes a ring oscillator with a select signal and an output. A counter is connected in parallel with the ring oscillator, while an arithmetic logic unit receives a "COMPARE" value from a register and the counter output. Upper and lower bound registers store acceptable tolerances for non-linearity, and comparators assess these tolerances against the output of the arithmetic logic unit. An AND gate generates a signal indicative of the state of the oscillator.

Career Highlights

Mark W Maloney is associated with Agilent Technologies, Inc., where he has applied his expertise in developing innovative testing solutions. His work has had a lasting impact on the efficiency and accuracy of testing methodologies in the industry.

Collaborations

Throughout his career, Mark has collaborated with esteemed colleagues such as Eugene A Roylance and Robert D Morrison. These partnerships have fostered a creative environment that has led to advancements in their respective fields.

Conclusion

Mark W Maloney's contributions to delay line linearity testing exemplify the spirit of innovation. His work continues to influence the industry, showcasing the importance of effective testing methodologies.