Mark A Michniewicz

Title: Mark A Michniewicz: Innovator in Optical Measurement Technology

Introduction

Mark A Michniewicz is a notable inventor based in Highland, MI (US). He has made significant contributions to the field of optical measurement technology, particularly in the area of three-dimensional surface topography. His innovative approach has led to advancements that enhance the accuracy and efficiency of surface measurements.

Latest Patents

Mark A Michniewicz holds a patent for an "Optical method and system for measuring three-dimensional surface topography of an object having a surface contour." This invention provides high-resolution contour measurements using interferometric methods. The system utilizes co-sight detector technology to capture at least three independent images of the same object location, each with a known fringe pattern. The simultaneous collection of multiple phase images allows for very high-speed 3D data generation, overcoming previous limitations of phase shift technology such as sample motion and vibration. The method can employ continuous or strobed illumination and can be constructed without moving parts, resulting in a more cost-effective assembly with improved repeatability.

Career Highlights

Mark A Michniewicz is associated with Integral Vision, Inc., where he continues to develop and refine his innovative optical measurement systems. His work has positioned him as a key figure in advancing measurement technologies that are crucial for various applications.

Collaborations

Mark collaborates with Matthew P Frazer, contributing to the development of cutting-edge technologies in their field.

Conclusion

Mark A Michniewicz's contributions to optical measurement technology exemplify the impact of innovation in enhancing measurement accuracy and efficiency. His work continues to influence the industry and pave the way for future advancements.