This inventor holds 1 USPTO granted patent. Top assignee: Magyar Tudomanyos Akademia Muszaki Fizikai Kutato Intezete. Active years: 1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1991
Title: Maria Somogyi: Innovating Layer Thickness Measurement
Introduction
Maria Somogyi, a prominent inventor based in Budapest, Hungary, has made significant contributions to the field of measuring technology. With her innovative approach, she has developed a patent that showcases her expertise in scientific measurement techniques.
Latest Patents
Maria is credited with one patent titled "Method and apparatus for determining the layer thickness of," which reflects her dedication to advancing measurement methodologies. This patent underscores her technical proficiency and innovative spirit.
Career Highlights
Maria Somogyi is associated with the Research Institute for Technical Physics and Material Science, part of the Hungarian Academy of Sciences. Her work at this esteemed institution highlights her commitment to research and the application of technology in practical scenarios.
Collaborations
Throughout her career, Maria has collaborated with notable colleagues, including Gyorgy Ferenczi and Katalin Erdelyi. These partnerships have enriched her research endeavors and have contributed to the advancement of knowledge in her field.
Conclusion
Maria Somogyi stands out as a talented inventor whose work has potential implications across various applications. Her dedication to innovating measurement techniques positions her as an important figure in the realm of scientific research and development.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile